Accurate interlayer distance measurement in bilayer graphene on SiC by high-resolution electron microscopy data analysis

Micron 2026

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Authors: Alexander S. Prikhodko, Н. И. Боргардт

DOI: 10.1016/j.micron.2026.104002

Cited by: 0

References: 51

Fields of Study & Subjects

Advanced Electron Microscopy Techniques and Applications Graphene research and applications Electron and X-Ray Spectroscopy Techniques

References 51