J³SPM AI: An integrated open-source platform for AI-assisted image analysis and image-guided workflows in scanning probe microscopy

Micron 2026

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Authors: SangHeon Lee

DOI: 10.1016/j.micron.2026.104017

Cited by: 2

References: 18

Fields of Study & Subjects

Force Microscopy Techniques and Applications Advanced Electron Microscopy Techniques and Applications Piezoelectric Actuators and Control

References 18