Deep learning assisted particle size ranking and estimation from SEM images without explicit segmentation
Fields of Study & Subjects
Mineral Processing and Grinding
Advanced Electron Microscopy Techniques and Applications
Electron and X-Ray Spectroscopy Techniques
Publication details
- Journal / source
- Micron
- Publisher
- Elsevier BV
- Volume
- 204
- Pages
- 104022–104022
- Publication date
- 26 March 2026
- Language
- EN