The effects of gamma irradiation of SiC- and Si-MOSFETs on their response to electrical stress and thermal annealing
Fields of Study & Subjects
Radiation Effects in Electronics
Semiconductor materials and devices
Advancements in Semiconductor Devices and Circuit Design
Publication details
- Journal / source
- Microelectronics Reliability
- Volume
- 177
- Pages
- 115993–115993
- Publication date
- 2 January 2026
- Language
- EN