A data-driven self-terminating write circuit with enhanced reliability for STT-MRAM using MUX logic

Microelectronics Reliability 2026

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Authors: Ravi S. Siddanath, Mohit Gupta, Souvik Kumar Das, G.K. Prasad, Manish Goswami, Kavindra Kandpal

DOI: 10.1016/j.microrel.2026.116006

Cited by: 1

References: 26

Fields of Study & Subjects

Magnetic properties of thin films Magnetic Properties and Applications Quantum and electron transport phenomena

References 26