Correlation of trap generation in SiC MOSFETs under γ-ray irradiation and bias temperature stress

Microelectronics Reliability 2026

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Authors: Xiaowen Liang, Dan Zhang, Ying Wei, Jie Feng, Qiwen Zheng, Lin Wen, Xuefeng Yu, Qi Guo, Teng Zhang, Yudong Li

DOI: 10.1016/j.microrel.2026.116007

Cited by: 1

References: 34

Fields of Study & Subjects

Silicon Carbide Semiconductor Technologies Radiation Effects in Electronics Semiconductor materials and devices

References 34