In-situ study on the electrochemical migration behavior of Ag and Sn in halogen media

Microelectronics Reliability 2026

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Authors: Guo Yu, Wei Dai, Yixing Lu, Yue Zhen, Jin Li, Yiming Jiang, Yangting Sun

DOI: 10.1016/j.microrel.2026.116015

Cited by: 1

References: 38

Fields of Study & Subjects

Electrodeposition and Electroless Coatings Corrosion Behavior and Inhibition Molten salt chemistry and electrochemical processes

References 38