Degradation mechanisms of gate oxide reliability in SiC Power MOSFETs under different energy proton irradiation

Microelectronics Reliability 2026

View at publisher

Authors: Binrui Xue, Ying Wei, Mingzhu Xun, Dan Zhang, Xiaowen Liang, Jiaxing Wang, Jingyi Xu, Jie Feng, Xuefeng Yu, Lin Wen, Qi Guo, Yudong Li

DOI: 10.1016/j.microrel.2026.116035

Cited by: 0

References: 25

Fields of Study & Subjects

Radiation Effects in Electronics Silicon Carbide Semiconductor Technologies Particle Detector Development and Performance

References 25