A novel VDMOS structure with low reverse recovery charge via process-compatible MOS-channel diode integration

Microelectronics Reliability 2026

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Authors: Yong Zhang, Ran Tao, Dawei Gao

DOI: 10.1016/j.microrel.2026.116036

Cited by: 0

References: 11

Fields of Study & Subjects

Silicon Carbide Semiconductor Technologies Advancements in Semiconductor Devices and Circuit Design Semiconductor materials and devices

References 11