Influence of high frequency power cycles on SiC power module lifetime under automotive mission profile

Microelectronics Reliability 2026

View at publisher
Authors: Bernardo Cougo, Israel Divan, Duc-Hoan Tran, Lenin Martins Ferreira Morais, Vitor Araujo, Renata Oliveira de Sousa, Marina Labalette, Valeria Rustichelli, Caio C O Mendes, Bruno Condamin, Fabio Coccetti
DOI: 10.1016/j.microrel.2026.116037
Cited by: 1
References: 18

Fields of Study & Subjects

Silicon Carbide Semiconductor Technologies HVDC Systems and Fault Protection Electromagnetic Compatibility and Noise Suppression

Publication details

Journal / source
Microelectronics Reliability
Publisher
Elsevier BV
Volume
178
Pages
116037–116037
Publication date
28 January 2026
Language
EN