A junction-engineered SCR-based ESD protection device for radio-frequency and high-speed serial link interface circuits

Microelectronics Reliability 2026

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Authors: Chen-Yu Liang, Ming‐Dou Ker
DOI: 10.1016/j.microrel.2026.116040
Cited by: 0
References: 15

Fields of Study & Subjects

Electrostatic Discharge in Electronics Silicon Carbide Semiconductor Technologies Electromagnetic Compatibility and Noise Suppression

Publication details

Journal / source
Microelectronics Reliability
Volume
178
Pages
116040–116040
Publication date
7 February 2026
Language
EN