Intelligent hardware acceleration optimization method for real-time junction temperature evaluation of power IGBT modules

Microelectronics Reliability 2026

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Authors: Shenglei Zou, Yuan Yang, Yang Wen, Tao Huang, Xingfeng Du, Yaxin Wang, Yan Li
DOI: 10.1016/j.microrel.2026.116041
Cited by: 1
References: 30

Fields of Study & Subjects

Silicon Carbide Semiconductor Technologies Photovoltaic System Optimization Techniques Real-time simulation and control systems

Publication details

Journal / source
Microelectronics Reliability
Publisher
Elsevier BV
Volume
179
Pages
116041–116041
Publication date
16 February 2026
Language
EN