Long-term drift of a bandgap voltage reference by molding compound oxidation during extended thermal aging

Microelectronics Reliability 2026 Open access

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Authors: Edinso Gabriel Marina Alonzo, René Theodora Hubertus Rongen, M. van Soestbergen, Pierre Turpin, P. Tounsi, Sonia Ben-Dhia
DOI: 10.1016/j.microrel.2026.116043
Cited by: 2
References: 2

Fields of Study & Subjects

Semiconductor materials and devices Silicon Carbide Semiconductor Technologies Electronic Packaging and Soldering Technologies

Publication details

Journal / source
Microelectronics Reliability
Publisher
Elsevier BV
Volume
179
Pages
116043–116043
Publication date
17 February 2026
Language
EN