Thermal-optical coupled reliability for micro-LED projection systems: Mechanistic modeling and parametric analysis
Fields of Study & Subjects
Semiconductor Lasers and Optical Devices
GaN-based semiconductor devices and materials
Advanced optical system design
Publication details
- Journal / source
- Microelectronics Reliability
- Publisher
- Elsevier BV
- Volume
- 179
- Pages
- 116044–116044
- Publication date
- 13 February 2026
- Language
- EN