Inductance and capacitance parasitic prediction thanks to data analysis applied to Si and SiC MOSFET wide frequency band characterization

Microelectronics Reliability 2026

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Authors: P-E. Vidal, Guillaume Viné, Stéphane Baffreau, Anusha Gopishetti, T.L. Le

DOI: 10.1016/j.microrel.2026.116047

Cited by: 0

References: 5

Fields of Study & Subjects

Silicon Carbide Semiconductor Technologies Electromagnetic Compatibility and Noise Suppression Integrated Circuits and Semiconductor Failure Analysis

References 5