Dynamic humidity testing of SiC power semiconductors

Microelectronics Reliability 2026 Open access

Read full text
Authors: Yana Angelova, Uwe Stickelmann, Oliver Hoelbe, Marc Tuellmann, Oliver Schilling, Paul Salmen
DOI: 10.1016/j.microrel.2026.116119
Cited by: 2
References: 14

Fields of Study & Subjects

Silicon Carbide Semiconductor Technologies Advanced ceramic materials synthesis Calibration and Measurement Techniques

Publication details

Journal / source
Microelectronics Reliability
Publisher
Elsevier BV
Volume
180
Pages
116119–116119
Publication date
20 March 2026
Language
EN