Toward stable FeFET multi-level cell operations using novel weight freezing methodology with recovery cycling scheme for neuromorphic applications

Microelectronics Reliability 2026 Open access

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Authors: Jing-Hua Hsuen, Hsien-Yang Liu, Maximillian Lederer, Yannick Raffel, Konrad Seidel, Thomas Kämpfe, Sourav De, Chiung-Yuan Lin, Tian‐Li Wu
DOI: 10.1016/j.microrel.2026.116128
Cited by: 1
References: 19

Fields of Study & Subjects

Ferroelectric and Negative Capacitance Devices Magnetic properties of thin films Advanced Memory and Neural Computing

Publication details

Journal / source
Microelectronics Reliability
Publisher
Elsevier BV
Volume
181
Pages
116128–116128
Publication date
6 April 2026
Language
EN