Self-recovery RRD-12T SRAM cell-based array for fault-tolerant energy-efficient memory systems

Microelectronics Reliability 2026

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Authors: A. Srividyabarathi, P. Deepa

DOI: 10.1016/j.microrel.2026.116155

Cited by: 1

References: 22

Fields of Study & Subjects

Radiation Effects in Electronics VLSI and Analog Circuit Testing Low-power high-performance VLSI design

References 22