Dynamic electro-thermal circuit modeling for vertical NiO/β-Ga2O3 p–n diodes

Microelectronics Reliability 2026

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Authors: Yunyeong Choi, Youngkwan Cho, Dongbin Kim, Byung Jin Cho, Myunghun Shin

DOI: 10.1016/j.microrel.2026.116157

Cited by: 1

References: 46

Fields of Study & Subjects

Ga2O3 and related materials GaN-based semiconductor devices and materials Transition Metal Oxide Nanomaterials

References 46