Reliability verification of a dual-car elevator ASIC in SCL 180-nm CMOS: NBTI aging, multi-corner timing, and ISO 26262 ASIL-B collision avoidance

Microelectronics Reliability 2026

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Authors: A. Sriram, T. N. Prabakar

DOI: 10.1016/j.microrel.2026.116213

Cited by: 1

References: 13

Fields of Study & Subjects

Radiation Effects in Electronics Semiconductor materials and devices Electrostatic Discharge in Electronics

References 13