Towards power device packaging: Development of Cu-Au 10min direct bonding to replace sintered Ag paste using high interface density surface activation layers
Fields of Study & Subjects
Electronic Packaging and Soldering Technologies
3D IC and TSV technologies
Copper Interconnects and Reliability
Publication details
- Journal / source
- Materials Science and Engineering A
- Publisher
- Elsevier BV
- Volume
- 954
- Pages
- 149812–149812
- Publication date
- 20 January 2026
- Language
- EN