Cap-layer engineering in AlGaN/GaN HEMTs with AlN buffer for enhanced breakdown and Johnson Figure of Merit
Fields of Study & Subjects
GaN-based semiconductor devices and materials
Silicon Carbide Semiconductor Technologies
Advancements in Semiconductor Devices and Circuit Design
Publication details
- Journal / source
- Materials Science and Engineering B
- Publisher
- Elsevier BV
- Volume
- 327
- Pages
- 119223–119223
- Publication date
- 22 January 2026
- Language
- EN