Nanodot conductive atomic force microscopy

Materials Science and Engineering R Reports 2026

View at publisher
Authors: Osamah Alharbi, Yue Yuan, Wenwen Zheng, Yue Ping, Sebastian Matias Pazos, Husam Alshareef, Kaichen Zhu, Mario Lanza
DOI: 10.1016/j.mser.2026.101187
Cited by: 1
References: 32

Fields of Study & Subjects

Force Microscopy Techniques and Applications Molecular Junctions and Nanostructures Advanced Sensor and Energy Harvesting Materials

Publication details

Journal / source
Materials Science and Engineering R Reports
Publisher
Elsevier BV
Volume
169
Pages
101187–101187
Publication date
20 January 2026
Language
EN