A cut-back like method to measure the losses in integrated silicon nitride waveguides

Materials Science in Semiconductor Processing 2026

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Authors: Mariano Aceves -Mijares, J. Pedraza-Chávez, J.Félix Aguilar, J.E. Zamudio-Interian, Oscar Pérez-Díaz, Rubén Manuel López-Guardado

DOI: 10.1016/j.mssp.2025.110397

Cited by: 1

References: 13

Fields of Study & Subjects

Photonic and Optical Devices Semiconductor Lasers and Optical Devices Near-Field Optical Microscopy

References 13