Forming-free Al/ZnO/Al memristors as near-ideal physical unclonable functions: Surface defect chemistry and interfacial conduction analysis
Fields of Study & Subjects
Physical Unclonable Functions (PUFs) and Hardware Security
Advanced Memory and Neural Computing
Ferroelectric and Negative Capacitance Devices
Publication details
- Journal / source
- Materials Science in Semiconductor Processing
- Publisher
- Elsevier BV
- Volume
- 216
- Pages
- 111070–111070
- Publication date
- 18 August 2026
- Language
- EN