Physical models for simulating the magnetic flux leakage field of defects

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Authors: Zhiyuan Hu, Muhong Guo, Ranran Huang, Chuntian Zhao, Hongmei Li
Cited by: 1
References: 22

Fields of Study & Subjects

Non-Destructive Testing Techniques Magnetic Properties and Applications Magnetic Field Sensors Techniques

Publication details

Journal / source
NDT & E International
Publisher
Elsevier BV
Volume
162
Pages
103727–103727
Publication date
1 April 2026
Language
EN