Subwavelength microwave near-field imaging enabled by a novel dielectric-loaded waveguide probe for high-resolution nondestructive evaluation of multiscale defects in aerospace composites

NDT & E International 2026

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Authors: Mingyu Gao, Yulong Zhou, Jiaye Chen, Guohui Yang, Zhipeng Liang, Fei Wang (19534), Peng Song, Honghao Yue, Junyan Liu

DOI: 10.1016/j.ndteint.2026.103793

Cited by: 1

References: 24

Fields of Study & Subjects

Near-Field Optical Microscopy Microwave and Dielectric Measurement Techniques Electromagnetic Compatibility and Measurements

References 24