First demonstration of single event effects induced by secondary heavy ion beams at RAON

Nuclear Engineering and Technology 2026 Open access

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Authors: M. S. Kwag, Dong Geon Kim, Cheolmin Ham, Kwang-Bok Lee, Seong Jae Pyeun, M. H. Kim, Jae Cheon Kim, Changwook Son, CheongSoo Lee, Donghyun Kwak, Eunhee Kim, Geonhee Oh
+5 more Sangjin Lee, Guen-Young Park, Taehyo Kim, Woojun Lee, Kyoungho Tshoo
DOI: 10.1016/j.net.2025.104105
Cited by: 0
References: 26

Abstract

The first experimental demonstration of SEE (single event effect) induced by secondary heavy ion beams was performed at RAON. The secondary beams were produced via the projectile-like fragmentation, and delivered to a commercial LM4050 precision voltage reference under high vacuum conditions using KoBRA. The transient perturbations in output voltage, typical of SEEs, were observed in the device, without permanent damage. This work demonstrates the feasibility of employing secondary beams, including rare isotopes, for SEE testing of semiconductor devices and establishes a proof-of-concept for future radiation hardness evaluations.

Fields of Study & Subjects

Radiation Effects in Electronics Radiation Therapy and Dosimetry Space Technology and Applications

Publication details

Journal / source
Nuclear Engineering and Technology
Volume
58
Issue
4
Pages
104105–104105
Publication date
6 January 2026
Language
EN