BMMC-GAN: A bi-directional mapping and multi-category controlled generative adversarial network for diverse industrial defect images generation

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Authors: Junchao Chen, Yahui Cheng, Guojun Wen, Xingyue Liu
Cited by: 1
References: 22

Fields of Study & Subjects

Industrial Vision Systems and Defect Detection Advanced Neural Network Applications Generative Adversarial Networks and Image Synthesis

Publication details

Journal / source
Neurocomputing
Publisher
Elsevier BV
Volume
672
Pages
132859–132859
Publication date
26 January 2026
Language
EN