Evaluating similitude and robustness of deep image denoising models via adversarial attack
Fields of Study & Subjects
Adversarial Robustness in Machine Learning
Cell Image Analysis Techniques
Integrated Circuits and Semiconductor Failure Analysis
Publication details
- Journal / source
- Neurocomputing
- Publisher
- Elsevier BV
- Volume
- 687
- Pages
- 133674–133674
- Publication date
- 16 April 2026
- Language
- EN