Evaluating similitude and robustness of deep image denoising models via adversarial attack

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Authors: Jie Ning, Jiebao Sun, Yao Li, Zhichang Guo, Yao Li, Boying Wu
Cited by: 3
References: 21

Fields of Study & Subjects

Adversarial Robustness in Machine Learning Cell Image Analysis Techniques Integrated Circuits and Semiconductor Failure Analysis

Publication details

Journal / source
Neurocomputing
Publisher
Elsevier BV
Volume
687
Pages
133674–133674
Publication date
16 April 2026
Language
EN