Defect evolution and its impact on phonon transport and thermoelectric performance

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Authors: Baohai Jia, Xiao Chao Xu, Jiaqing He
Cited by: 1
References: 63

Fields of Study & Subjects

Advanced Thermoelectric Materials and Devices Thermal properties of materials Semiconductor materials and interfaces

Publication details

Journal / source
Newton
Publisher
Elsevier BV
Volume
2
Issue
9
Pages
100526–100526
Publication date
19 May 2026
Language
EN