Segmentation method comparison for residual fiber length measurement across tiled microscopy images

Next research. 2026

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Authors: Chris O’Brien, Jay Pike, LUIS MARTINEZ, Chad Duty, Seokpum Kim, Kris Villez

DOI: 10.1016/j.nexres.2026.101360

Cited by: 0

References: 50

Fields of Study & Subjects

Advanced Neural Network Applications Industrial Vision Systems and Defect Detection Machine Learning in Materials Science

References 50