Study on the angular effect of single event burnout induced by atmospheric neutrons in SiC power MOSFETs

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms 2026

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Authors: Haoming Wang, Chao Peng, Zhifeng Lei, Zhangang Zhang, Teng Ma, Hong Zhang, Yujuan He, Xiangli Zhong, Hongjia Song, Zhao Fu, Jinbin Wang, Xiaoping Ouyang
DOI: 10.1016/j.nimb.2026.166047
Cited by: 0
References: 26

Fields of Study & Subjects

Radiation Effects in Electronics Silicon Carbide Semiconductor Technologies Fusion materials and technologies

Publication details

Journal / source
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms
Volume
573
Pages
166047–166047
Publication date
11 February 2026
Language
EN