Single event upset mechanism transition and radiation hardening in 28 nm D flip-flops under proton irradiation

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Authors: Yi Gao, Zhaoming Huang, Xinpei Duan, Lili Zhang, Lei Dong, Pei Yang, Jiawei Chen, Tao Wang (12008), Yanan Yin, Yao Jin, Xinjie Zhou
Cited by: 0
References: 24

Fields of Study & Subjects

Radiation Effects in Electronics Particle Detector Development and Performance Radiation Therapy and Dosimetry

Publication details

Journal / source
Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms
Volume
574
Pages
166075–166075
Publication date
3 March 2026
Language
EN