Single event upset mechanism transition and radiation hardening in 28 nm D flip-flops under proton irradiation
Fields of Study & Subjects
Radiation Effects in Electronics
Particle Detector Development and Performance
Radiation Therapy and Dosimetry
Publication details
- Journal / source
- Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms
- Volume
- 574
- Pages
- 166075–166075
- Publication date
- 3 March 2026
- Language
- EN