Fast calibration method of axial distance error in ptychography based on linear model for initial object reconstruction
Fields of Study & Subjects
Advanced X-ray Imaging Techniques
Crystallography and Radiation Phenomena
Advanced Electron Microscopy Techniques and Applications
Publication details
- Journal / source
- Optics Communications
- Publisher
- Elsevier BV
- Volume
- 607
- Pages
- 132962–132962
- Publication date
- 27 January 2026
- Language
- EN