High-fidelity and noise-robust Fourier ptychographic microscopy for low-redundancy imaging

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Authors: Na Liu, Wanjie Tang, Zhoubin Chen, Kai Zhu, Tianjun Wang, Jiaju Wu, Huanhuan Yu, Jianze Cai, Huazheng Wu, Shaowei Jiang
Cited by: 1
References: 38

Fields of Study & Subjects

Advanced X-ray Imaging Techniques Advanced Fluorescence Microscopy Techniques Digital Holography and Microscopy

Publication details

Journal / source
Optics Communications
Publisher
Elsevier BV
Volume
607
Pages
132978–132978
Publication date
31 January 2026
Language
EN