Elliptically polarized illumination based photoelastic technique for weak stress measurement

Optics Communications 2026

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Authors: Wan Li, Zhilong Jiang, Aihui Sun, Yan Kong, Xiaoliang He, Cheng Liu (83733), Ling Wang

DOI: 10.1016/j.optcom.2026.133102

Cited by: 0

References: 29

Fields of Study & Subjects

Optical measurement and interference techniques Optical Polarization and Ellipsometry Optical and Acousto-Optic Technologies

References 29