Hi-ILT: A hybrid End-to-End framework of lightweight hierarchical VAE and physics-Guided ILT for inverse lithography technology

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Authors: Hui Xu, Tao Wang, Ziqiang Zhao, Ruijun Ma, Xiaoqing Wen, Huaguo Liang
Cited by: 1
References: 17

Fields of Study & Subjects

Advancements in Photolithography Techniques Advanced Neural Network Applications Physical Unclonable Functions (PUFs) and Hardware Security

Publication details

Journal / source
Optics and Lasers in Engineering
Publisher
Elsevier BV
Volume
200
Pages
109621–109621
Publication date
13 January 2026
Language
EN