Hi-ILT: A hybrid End-to-End framework of lightweight hierarchical VAE and physics-Guided ILT for inverse lithography technology
Fields of Study & Subjects
Advancements in Photolithography Techniques
Advanced Neural Network Applications
Physical Unclonable Functions (PUFs) and Hardware Security
Publication details
- Journal / source
- Optics and Lasers in Engineering
- Publisher
- Elsevier BV
- Volume
- 200
- Pages
- 109621–109621
- Publication date
- 13 January 2026
- Language
- EN