Robust ptychographic structured modulation microscopy enabled by feature-domain consistency

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Authors: Kun Li, Zhoubin Chen, Lingzhi Jiang, Ruihai Wang, 佳維 黄, Na Liu, Haibing Yin, Huazheng Wu, Shaowei Jiang, Chengfei Guo
Cited by: 0
References: 34

Fields of Study & Subjects

Advanced X-ray Imaging Techniques Adaptive optics and wavefront sensing Digital Holography and Microscopy

Publication details

Journal / source
Optics and Lasers in Engineering
Volume
201
Pages
109699–109699
Publication date
24 February 2026
Language
EN