Robust ptychographic structured modulation microscopy enabled by feature-domain consistency
Fields of Study & Subjects
Advanced X-ray Imaging Techniques
Adaptive optics and wavefront sensing
Digital Holography and Microscopy
Publication details
- Journal / source
- Optics and Lasers in Engineering
- Volume
- 201
- Pages
- 109699–109699
- Publication date
- 24 February 2026
- Language
- EN