Achieving picometer-level wavefront repeatability with an enhanced environmentally robust point diffraction interferometer
Fields of Study & Subjects
Optical measurement and interference techniques
Advanced X-ray Imaging Techniques
Digital Holography and Microscopy
Publication details
- Journal / source
- Optics and Lasers in Engineering
- Publisher
- Elsevier BV
- Volume
- 201
- Pages
- 109702–109702
- Publication date
- 28 February 2026
- Language
- EN