Enhancing the robustness of parameter estimation in structured illumination microscopy via self-supervised learning denoising

Optics and Lasers in Engineering 2026

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Authors: Zewei Luo, Lixin Zhang, Heyu Nie, Xu Li, Linlin Wang, Ge Wu, Tao Yang, Yong Hu, Tongsheng Chen

DOI: 10.1016/j.optlaseng.2026.109709

Cited by: 0

References: 40

Fields of Study & Subjects

Advanced Fluorescence Microscopy Techniques Image and Signal Denoising Methods Advanced Image Processing Techniques

References 40