Precise reconstruction of three-dimensional surface topography of the sidewalls of deep holes for the shape-from-focus microscopy
Fields of Study & Subjects
Image Processing Techniques and Applications
Optical measurement and interference techniques
Advanced X-ray Imaging Techniques
Publication details
- Journal / source
- Optics and Lasers in Engineering
- Publisher
- Elsevier BV
- Volume
- 204
- Pages
- 109875–109875
- Publication date
- 18 May 2026
- Language
- EN