Imaging-projecting collaborative inspection system based on galvanometers

Optics & Laser Technology 2026

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Authors: Shifeng Shi, Zidong Han, Liyan Zhang
DOI: 10.1016/j.optlastec.2026.114916
Cited by: 2
References: 22

Fields of Study & Subjects

Optical measurement and interference techniques Industrial Vision Systems and Defect Detection Advanced Measurement and Metrology Techniques

Publication details

Journal / source
Optics & Laser Technology
Publisher
Elsevier BV
Volume
198
Pages
114916–114916
Publication date
16 February 2026
Language
EN