Large depth range nanoscale axial resolution surface profile measurement using narrow bandwidth spectral domain-OCT
Fields of Study & Subjects
Optical Coherence Tomography Applications
Advanced Surface Polishing Techniques
Optical measurement and interference techniques
Publication details
- Journal / source
- Optics & Laser Technology
- Publisher
- Elsevier BV
- Volume
- 199
- Pages
- 115025–115025
- Publication date
- 3 March 2026
- Language
- EN