Large depth range nanoscale axial resolution surface profile measurement using narrow bandwidth spectral domain-OCT

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Authors: Jinyun Yue, Haoran Zhang, Yao Yu, Yi Wang (32470), Yuqian Zhao, Jingmin Luan, Jian Liu, Ning Ding, Zhenhe Ma
Cited by: 2
References: 42

Fields of Study & Subjects

Optical Coherence Tomography Applications Advanced Surface Polishing Techniques Optical measurement and interference techniques

Publication details

Journal / source
Optics & Laser Technology
Publisher
Elsevier BV
Volume
199
Pages
115025–115025
Publication date
3 March 2026
Language
EN