Fast Fourier ptychographic microscopy via Kramers-Kronig relations and feature-domain reconstruction

Optics & Laser Technology 2026

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Authors: Yanran Zhao, Jinghao Xu, Tianci Feng, Aiye Wang, Huiqin gao, Yushu Song, An Pan
DOI: 10.1016/j.optlastec.2026.115175
Cited by: 3
References: 28

Fields of Study & Subjects

Advanced X-ray Imaging Techniques Advanced Electron Microscopy Techniques and Applications Digital Holography and Microscopy

Publication details

Journal / source
Optics & Laser Technology
Publisher
Elsevier BV
Volume
200
Pages
115175–115175
Publication date
23 March 2026
Language
EN