High-quality Fourier single-pixel imaging using intermediate-bit bases
Fields of Study & Subjects
Random lasers and scattering media
Advanced Fluorescence Microscopy Techniques
Digital Holography and Microscopy
Publication details
- Journal / source
- Optics & Laser Technology
- Publisher
- Elsevier BV
- Volume
- 202
- Pages
- 115385–115385
- Publication date
- 30 April 2026
- Language
- EN