Deep-robust computational phase microscopy beyond the field of view limit
Fields of Study & Subjects
Digital Holography and Microscopy
Optical measurement and interference techniques
Advanced X-ray Imaging Techniques
Publication details
- Journal / source
- Optics & Laser Technology
- Publisher
- Elsevier BV
- Volume
- 203
- Pages
- 115532–115532
- Publication date
- 15 May 2026
- Language
- EN