Ultra-narrow linewidth measurement of laser based on mutation particle swarm optimization of Voigt spectrum iteration process
Fields of Study & Subjects
Advanced Measurement and Metrology Techniques
Semiconductor Lasers and Optical Devices
Optical Network Technologies
Publication details
- Journal / source
- Optics & Laser Technology
- Publisher
- Elsevier BV
- Volume
- 203
- Pages
- 115643–115643
- Publication date
- 30 May 2026
- Language
- EN