Near-field spectroscopy of low-dimensional silicon carbide

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Authors: Nishan Shrestha, Jose Castro, Andrew Crandall Jones, Sakineh Chabi
Cited by: 0
References: 38

Fields of Study & Subjects

Near-Field Optical Microscopy Plasmonic and Surface Plasmon Research Silicon Carbide Semiconductor Technologies

Publication details

Journal / source
Optical Materials
Volume
174
Pages
118010–118010
Publication date
5 March 2026
Language
EN