Exact sojourn time distribution for two-machine lines with multiple failure modes

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Authors: Chuan Shi
Cited by: 1
References: 14

Fields of Study & Subjects

Reliability and Maintenance Optimization VLSI and Analog Circuit Testing Coding theory and cryptography

Publication details

Journal / source
Operations Research Letters
Publisher
Elsevier BV
Volume
67
Pages
107444–107444
Publication date
29 March 2026
Language
EN