Exact sojourn time distribution for two-machine lines with multiple failure modes
Fields of Study & Subjects
Reliability and Maintenance Optimization
VLSI and Analog Circuit Testing
Coding theory and cryptography
Publication details
- Journal / source
- Operations Research Letters
- Publisher
- Elsevier BV
- Volume
- 67
- Pages
- 107444–107444
- Publication date
- 29 March 2026
- Language
- EN